Effects of Uniaxial Stress on Dielectric Properties of PZT, BT and 0.55PZT-0.45BT Ceramics

Abstract

Effects of uniaxial stress on the dielectric properties of PZT, BT and 0.55PZT-0.45BT
ceramics are investigated. The ceramics are prepared by a conventional mixed-oxide method.
Phase formation behavior is studied by x-ray diffraction. The dielectric properties of PZT,
BT and 0.55PZT-0.45BT ceramics are observed under the uniaxial stress at low and highstress
levels using a compressometer. The results show that the dielectric constant of the
ceramics at low-stress level (0-700 kPa) increases slightly, while the dielectric loss tangent
changes uncertainly, with increasing applied stress. At higher stress levels (0-16 MPa), the
dielectric constant and the dielectric loss tangent of PZT and 0.55PZT-0.45BT ceramics
increase significantly with increasing applied stress. In the other hand, the dielectric constant
and the dielectric loss tangents of BT ceramic is reduce with increasing applied stress.These
results are believed to be caused by the domain structure changes to maintain the domain
energy at a minimum under applied stress.

Keywords : Dielectric properties, Uniaxial stress, PZT-BT